Fault tree analysis in case of multiple faults, especially covered and uncovered ones

Microelectronics Reliability

Volumn 38, Issue 4, 1998, Pages 659-663

  Schneeweiss, Winfrid G ^a  

^a UNIVERSITY OF HAGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN ALGEBRA; COMPUTATIONAL METHODS; MATHEMATICAL MODELS;

FAULT INDICATORS;

FAULT TREE ANALYSIS;

EID: 0032041575     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(97)00183-2     Document Type: Article

References (10)

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3. Doyle, S. and Bechta Dugan, J., Fault trees and imperfect coverage: a combinatorial approach. In Proc. 1993 Ann. Reliab. and Maintaniah. Symp. IEEE, 1993, pp. 214-219.
4. Singh, B. Global reliability of three-state systems. Microelectron. Reliab., 1996, 36, 241-242.
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8. Schneeweiss, W., Boolean Functions with Engineering Applications and Computer Programs, Springer, Berlin, 1989.
9. Schneeweiss, W. Fast fault tree evaluation for many sets of input data. IEEE Trans. Reliab., 1990, 39, 298-300.
10. Henley, E. and Kumamoto, H., Probabilistic Risk Assessment. IEEE Press, 1992.