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Volumn 38, Issue 4, 1998, Pages 659-663

Fault tree analysis in case of multiple faults, especially covered and uncovered ones

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN ALGEBRA; COMPUTATIONAL METHODS; MATHEMATICAL MODELS;

EID: 0032041575     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(97)00183-2     Document Type: Article
Times cited : (6)

References (10)
  • 1
    • 0014611556 scopus 로고
    • Reliability modeling techniques for self-repairing computer systems
    • Bouricius, W., Carter, W. and Schneider, P., Reliability modeling techniques for self-repairing computer systems. In Proc. 24th Ann. ACM Nat. Conf., 1969, pp. 295-309.
    • (1969) Proc. 24th Ann. ACM Nat. Conf. , pp. 295-309
    • Bouricius, W.1    Carter, W.2    Schneider, P.3
  • 4
    • 0030084694 scopus 로고    scopus 로고
    • Global reliability of three-state systems
    • Singh, B. Global reliability of three-state systems. Microelectron. Reliab., 1996, 36, 241-242.
    • (1996) Microelectron. Reliab. , vol.36 , pp. 241-242
    • Singh, B.1
  • 5
    • 0029289963 scopus 로고
    • Two reduced formulas for reliability evaluation of three-state device networks
    • Dong-Kui, L. and Hang-Zhong, C. Two reduced formulas for reliability evaluation of three-state device networks. Microelectron. Reliab., 1995, 35, 735-737.
    • (1995) Microelectron. Reliab. , vol.35 , pp. 735-737
    • Dong-Kui, L.1    Hang-Zhong, C.2
  • 6
    • 0021504780 scopus 로고
    • Disjoint Boolean products via Shannon's expansion
    • Schneeweiss, W. Disjoint Boolean products via Shannon's expansion. IEEE Trans. Reliab., 1984, 33, 329-332.
    • (1984) IEEE Trans. Reliab. , vol.33 , pp. 329-332
    • Schneeweiss, W.1
  • 7
    • 0027840931 scopus 로고
    • A procedure for generating sums of disjoint products
    • Singh, B. A procedure for generating sums of disjoint products. Microelectron. Reliab., 1993, 33, 2269-2272.
    • (1993) Microelectron. Reliab. , vol.33 , pp. 2269-2272
    • Singh, B.1
  • 9
    • 0025473103 scopus 로고
    • Fast fault tree evaluation for many sets of input data
    • Schneeweiss, W. Fast fault tree evaluation for many sets of input data. IEEE Trans. Reliab., 1990, 39, 298-300.
    • (1990) IEEE Trans. Reliab. , vol.39 , pp. 298-300
    • Schneeweiss, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.