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Volumn 29, Issue 4-5, 1998, Pages 171-179

Modelling and experimental study of heat deposition and transport in a semiconductor laser diode

Author keywords

[No Author keywords available]

Indexed keywords

HEAT TRANSFER; LIGHT ABSORPTION; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; PHOTONS; SEMICONDUCTING INDIUM COMPOUNDS; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT;

EID: 0032041553     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2692(97)00055-4     Document Type: Article
Times cited : (7)

References (12)
  • 1
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    • Temperature field determination of InGaAsP/InP lasers by photothermal microscopy: Evidence for weak nonradiative processes at the facets
    • Mansanares, A.M., Roger, J.P., Fournier, D. and Boccara, A.C. Temperature field determination of InGaAsP/InP lasers by photothermal microscopy: evidence for weak nonradiative processes at the facets, Appl. Phys. Lett., 64 (1994) 4-6.
    • (1994) Appl. Phys. Lett. , vol.64 , pp. 4-6
    • Mansanares, A.M.1    Roger, J.P.2    Fournier, D.3    Boccara, A.C.4
  • 2
    • 0030084630 scopus 로고
    • Laser beam thermography of circuits in the particular case of passivated semiconductors
    • Quintard, V., Deboy, G., Dilhaire, S., Lewis, D., Phan, T. and Claeys, W. Laser beam thermography of circuits in the particular case of passivated semiconductors, Microelectronic Eng., 31 (1994) 291-298.
    • (1994) Microelectronic Eng. , vol.31 , pp. 291-298
    • Quintard, V.1    Deboy, G.2    Dilhaire, S.3    Lewis, D.4    Phan, T.5    Claeys, W.6
  • 3
    • 0027629313 scopus 로고
    • Thermoreflectance optical test probe for the measurement of current induced temperature change in microelectronic components
    • Claeys, W., Dilhaire, S., Quintard, V., Dom, J.P. and Danto, Y. Thermoreflectance optical test probe for the measurement of current induced temperature change in microelectronic components, Quality Reliab. Eng. Int., 9 (1993) 303-308.
    • (1993) Quality Reliab. Eng. Int. , vol.9 , pp. 303-308
    • Claeys, W.1    Dilhaire, S.2    Quintard, V.3    Dom, J.P.4    Danto, Y.5
  • 5
    • 0016102063 scopus 로고
    • Catastrophic failure in GaAs double-heterostructure injection laser
    • Hakki, B.W. and Nash, F.R. Catastrophic failure in GaAs double-heterostructure injection laser, J. Appl. Phys., 45 (1974) 3907-3912.
    • (1974) J. Appl. Phys. , vol.45 , pp. 3907-3912
    • Hakki, B.W.1    Nash, F.R.2
  • 7
    • 0027652450 scopus 로고
    • Facet heating of quantum well lasers
    • Chen, G. and Tien, C.L. Facet heating of quantum well lasers, J. Appl. Phys., 74 (1993) 2167-2174.
    • (1993) J. Appl. Phys. , vol.74 , pp. 2167-2174
    • Chen, G.1    Tien, C.L.2
  • 8
    • 0000351051 scopus 로고
    • Evidence for current-density-induced heating of AlGaAs single-quantum-well laser facets
    • Tang, W.C., Rosen, H.J., Vettiger, P. and Webb, D.J. Evidence for current-density-induced heating of AlGaAs single-quantum-well laser facets, Appl. Phys. Lett., 59 (1991) 1005-1007.
    • (1991) Appl. Phys. Lett. , vol.59 , pp. 1005-1007
    • Tang, W.C.1    Rosen, H.J.2    Vettiger, P.3    Webb, D.J.4
  • 11
    • 0027904123 scopus 로고
    • Mirror temperature of semiconductor diode laser studied with a photothermal deflection method
    • Bertolotti, M., Liakhou, G., Li Voti, R., Wang, R.P. and Yakovlev, V.P. Mirror temperature of semiconductor diode laser studied with a photothermal deflection method, J. Appl. Phys., 74 (1993) 7054-7060.
    • (1993) J. Appl. Phys. , vol.74 , pp. 7054-7060
    • Bertolotti, M.1    Liakhou, G.2    Li Voti, R.3    Wang, R.P.4    Yakovlev, V.P.5
  • 12
    • 0028532318 scopus 로고
    • New method for the study of mirror heating of a semiconductor laser diode and for the determination of thermal diffusivity of the entire structure
    • Bertolotti, M., Liakhou, G., Li Voti, R., Sibilia, C., Syrbu, A. and Wang, R.P. New method for the study of mirror heating of a semiconductor laser diode and for the determination of thermal diffusivity of the entire structure, Appl. Phys. Lett., 65 (1994) 2266-2268.
    • (1994) Appl. Phys. Lett. , vol.65 , pp. 2266-2268
    • Bertolotti, M.1    Liakhou, G.2    Li Voti, R.3    Sibilia, C.4    Syrbu, A.5    Wang, R.P.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.