Stresses around the crack tip due to electric current and self-induced magnetic field

Advances in Engineering Software

Volumn 29, Issue 3-6, 1998, Pages 297-306

  Cai, Gary X ^a   Yuan, F G ^b  

^a Structures Technology   (United States)

^b North Carolina State University   (United States)

Author keywords

Crack tip; Self induced magnetic field; Stress

Indexed keywords

ALGORITHMS; CONDUCTIVE MATERIALS; CRACKS; ELECTRIC CURRENTS; INTEGRAL EQUATIONS; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; NUMERICAL ANALYSIS; STRESS CONCENTRATION; STRESS INTENSITY FACTORS;

BIOT-SAVART INTEGRAL EQUATIONS; ELECTROMAGNETIC FORCE; SELF-INDUCED MAGNETIC FIELDS;

STRESS ANALYSIS;

EID: 0032041210     PISSN: 09659978     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9978(97)00078-1     Document Type: Article

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