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Volumn 46, Issue 7, 1998, Pages 2299-2303

Buffer layer morphology effects on the ordering of epitaxial FePd(001) thin films

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MAGNESIA; MORPHOLOGY; SUBSTRATES; THIN FILMS; VACUUM APPLICATIONS;

EID: 0032036139     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)80010-4     Document Type: Article
Times cited : (8)

References (15)
  • 15
    • 0003472812 scopus 로고
    • Dover Publications, New York
    • Warren, B. E., X-ray diffraction. Dover Publications, New York, 1990, p. 253.
    • (1990) X-ray Diffraction , pp. 253
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.