Determination of the shear force magnitude in near-field scanning optical microscopy

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 159-163

  Wei, P K ^a   Fann, W S ^a,b  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; GLASS; MATHEMATICAL MODELS; PROBES;

CONTINUUM MECHANICAL BEAM EQUATION; MODIFIED BEAM DIFFRACTION METHOD; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SHEAR FORCE MECHANISMS;

OPTICAL MICROSCOPY;

ARTICLE; CALCULATION; DIFFRACTION; FORCE; OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032033250     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00063-6     Document Type: Article

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