Tribology of the helical scan head tape interface

Wear

Volumn 215, Issue 1-2, 1998, Pages 91-97

  Prabhakaran, Vijay ^a   Kim, Soo Kyung ^a   Talke, Frank E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Head; Helical; Humidity; Stain; Tape; Wear

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; INTERFACES (MATERIALS); MAGNETIC TAPE; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE; TRIBOLOGY; VIDEOCASSETTE RECORDERS; WEAR OF MATERIALS; X RAY ANALYSIS;

ENERGY DISPERSIVE X RAY ANALYSIS (EDX); VIDEO HELICAL SCANNER HEADS;

MAGNETIC HEADS;

MAGNETIC RECORDING; TRIBOLOGY; WEAR;

EID: 0032029165     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(97)00274-3     Document Type: Article

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