Chopped radiation measurements with large area Si photodiodes

Journal of Research of the National Institute of Standards and Technology

Volumn 103, Issue 2, 1998, Pages 153-162

  Eppeldauer, George ^a,b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NIST Physics Laboratory   (United States)

Author keywords

Bode plot; Chopped light; Detector; Frequency dependence; Gain; Measurement; Optical radiation; Photocurrent; Photodiode; Radiometer, responsivity; Silicon

Indexed keywords

AMPLIFICATION; BODE DIAGRAMS; ELECTRIC VARIABLES MEASUREMENT; GAIN MEASUREMENT; PHOTOCONDUCTIVITY; PHOTODIODES; RADIATION; RADIOMETRY; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE;

BODE PLOT; CHOPPED LIGHT; CHOPPED RADIATION MEASUREMENT; DRIFT AMPLIFICATION; FREQUENCY DEPENDENT RESPONSE; NOISE BOOSTING EFFECT; PHOTOCURRENT;

RADIOACTIVITY MEASUREMENT;

EID: 0032028588     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.103.009     Document Type: Article

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