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Volumn 215, Issue 1-2, 1998, Pages 54-58

In-process measurement of surface roughness using light scattering

Author keywords

In process measurement; Light scattering; Surface roughness; Topography

Indexed keywords

GRINDING MACHINES; LIGHT SCATTERING; SURFACE ROUGHNESS;

EID: 0032028437     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(97)00279-2     Document Type: Article
Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.