Surface roughness characterisation of a thin transparent dielectric-silver tandem by spectroscopic light scattering

Solar Energy Materials and Solar Cells

Volumn 52, Issue 1-2, 1998, Pages 37-43

  Ronnow D ^a   Eisenhammer, T ^b   Roos, A ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b TiNOX GmbH   (Germany)

Author keywords

Dielectric silver tandem; Roughness; Spectroscopic light scattering

Indexed keywords

DIELECTRIC MATERIALS; GLASS; GLAZES; INTERFACES (MATERIALS); LIGHT SCATTERING; SILVER; SPECTROSCOPIC ANALYSIS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS;

DIELECTRIC SILVER TANDEM; SPECTROSCOPIC LIGHT SCATTERING;

MULTILAYERS;

EID: 0032028218     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(97)00268-7     Document Type: Article

References (19)

1. C.A. Bishop, R.P. Howson, Sol. Energy Mater. 13 (1986) 175.
2. J. Szczyrbowski, A. Dietrich, K. Hartig, Sol. Energy Mater. 19 (1989) 43.
3. International Energy Agency, Solar Heating and Cooling Programme, Task 18-Advanced Glazing and Associated Materials for Solar and Building Applications.
4. T.E. Johnson, Low-E Glazing Design Guide, Butterworth Architecture, Boston, 1991.
5. G. Woodard, T. Pass, Proc. SPIE (1992) 213.
6. G.B. Smith, G.A. Niklasson, J.S.E.M. Svensson, C.G. Granqvist, J. Appl. Phys. 59 (1986) 257.
7. K. Chiba, K. Nakatani, Thin Solid Films 112 (1984) 359.
8. R.C. Ross, Sol. Energy Mater. 21 (1990) 25.
9. P. Bousquet, F. Flory, P. Roche, J. Opt. Soc. Am. 71 (1981) 1115.
10. M.J. Elson, Theory and Software for Light Scattering from Multilayer Optical Components with Interfacial Roughness, Naval Air Warfare Center, Weapons Division, China Lake, CA, Technical Publication 8084, 1992.
11. J.M. Elson, J.P. Rahn, J.M. Bennett, Appl. Opt. 22 (1983) 3207.
12. C. Amra, J.H. Apfel, E. Pelletier, Appl. Opt. 31 (1992) 3134.
13. B. Vidal, P. Vincent, Appl. Opt. 23 (1984) 1794.
14. W. Spirkl, J. Appl. Phys. 74 (1993) 1776-1780.
15. T. Eisenhammer, F. Muggenthaler, Proc. SPIE 2255 (1994) 508.
16. D. Rönnow, E. Veszelei, Rev. Sci. Instr. 65 (1994) 327.
17. E.L. Church, Appl. Opt. 27 (1988) 1518.
18. T. Eisenhammer, Thin Solid Films 270 (1995) 55.
19. C.-G. Ribbing, E. Valkonen, Proc. SPIE 652 (1986) 166.