Microwave characterization and modeling of the surface impedance of fractal structure copper films

IEEE Transactions on Antennas and Propagation

Volumn 46, Issue 3, 1998, Pages 434-441

  Troncet, Emmanuel ^a   Ablart, Guy ^b   Allam, Levi ^a  

^a UNIVERSITÉ PAUL SABATIER   (France)

^b UNIVERSITÉ D'ORLÉANS   (France)

Author keywords

Fractals; Impedance measurement; Thin films

Indexed keywords

COPPER; ELECTRIC IMPEDANCE MEASUREMENT; ELECTROMAGNETIC WAVE DIFFRACTION; FRACTALS; MAXWELL EQUATIONS; PRINTED CIRCUITS; THIN FILMS;

FRACTAL STRUCTURE COPPER FILMS; FRESNEL'S DIFFRACTION THEORY;

METALLIC FILMS;

EID: 0032027823     PISSN: 0018926X     EISSN: None     Source Type: Journal    
DOI: 10.1109/8.662663     Document Type: Article

References (5)

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3. J.-F. Gouyet, Physique et Structures Fractales. Paris, France: Masson, 1992.
4. Centre d'Etudes et de Recherches de Toulouse!, Toulouse, 31400 France.
5. V. Nikolski, Electrodynamique et Propagation des Ondes Ra dioélectriques. Moscow, Russia: Mir, 1972.