Ensuring compactness, reliability, and scalability for the next generation of high-field lasers

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 4, Issue 2, 1998, Pages 376-383

  Nees, John ^b,i,j,k,l   Biswal, Subrat ^b,m   Druon, Frédéric ^b   Faure, Jérôme ^b,n,o   Nantel, Mark ^b,c   Mourou, Gérard A ^a,b   Nishimura, Akihiko ^d   Takuma, Hiroshi ^d   Itatani, Jiro ^e,f   Chanteloup, Jean Christophe ^g   Hönninger, Clemens ^h  

^a IEEE

^b UNIVERSITY OF MICHIGAN   (United States)

^c Photonics Research Ontario   (Canada)

^d JAPAN ATOMIC ENERGY AGENCY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

^f INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^g ECOLE POLYTECHNIQUE   (France)

^h ETH ZURICH   (Switzerland)

ⁱ KANSAS STATE UNIVERSITY   (United States)

^j UNIVERSITY OF ROCHESTER   (United States)

^k UNIVERSITY OF ROCHESTER   (United States)

^l OPTICAL SOCIETY OF AMERICA   (United States)

^m JOHNS HOPKINS UNIVERSITY   (United States)

ⁿ Universite d'Orsay   (France)

^o Universite d'Orsay ^*  (France)

more..

Author keywords

Deformable mirrors; Diode pumped solid state lasers; High focused intensity; High peak power; Petawatt; Terawatt; Ytterbium glass; Ytterbium laser materials

Indexed keywords

AMPLIFICATION; EFFICIENCY; FOCUSING; FORECASTING; PUMPING (LASER); RELIABILITY; YTTERBIUM COMPOUNDS;

HIGH POWER LASERS;

SOLID STATE LASERS;

EID: 0032027683     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.686745     Document Type: Article

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