Measurement of RF dielectric properties with series resonant microstrip elements

Microwave Journal

Volumn 41, Issue 3, 1998, Pages 22-93

  Rudy, Donald A ^a,b   Mendelsohn, Joseph P ^a,c,d,e   Muniz, Philip J ^a,c,f  

^a LUCENT TECHNOLOGIES   (United States)

^b WASHINGTON UNIVERSITY   (United States)

^c NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^d UNIVERSITY OF COLORADO   (United States)

^e Lockheed Martin Astro Space Division

^f RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC LOSSES; MICROSTRIP DEVICES; PERMITTIVITY MEASUREMENT; RESONANT CIRCUITS;

DIELECTRIC LOSS TANGENTS;

PRINTED CIRCUIT BOARDS;

EID: 0032027461     PISSN: 01926225     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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2. P.A. Rizzi, "ASTM-D-2520 Method B, Cavity Perturbation Method." Microwave Engineering Passive Circuits, Prentice Hall, 1988, p. 446.
3. T. Edwards, Foundations of Microstrip Circuit Design, Wiley, New York, 1992, p. 249ff.
4. IPC-TM-650 Test Method No. 2.5.5.5, January, 1991.
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7. R.P. Owens, The Radio and Electronic Engineer, Vol. 46, No. 7, July 1976, pp. 360-364.
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10. H. Pucel, D. Masse and C.P. Hartwig, IEEE Transactions on Microwave Theory and Techniques, No. 16, 1968, pp. 342-350.
11. E.O. Hammerstadt and F. Bekkadal, A Microstrip Handbook, ELAB Report STF44A74169, University of Trondheim, Norway, 1975.
12. H.D. Lending, Proceedings of the National Electronics Conference, Vol. 11, 1955, pp. 391-401.