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Journal of Imaging Science and Technology

Volumn 42, Issue 2, 1998, Pages 135-143

Comprehensive model for sulfur sensitization (2): Characterization of sulfur sensitization centers and fog centers

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CRYSTAL MICROSTRUCTURE; ELECTRON MICROSCOPY; IONS; MATHEMATICAL MODELS; OXIDATION; PHOTOSENSITIVITY; SENSITIVITY ANALYSIS; SPECTRUM ANALYSIS; SULFUR;

ELECTRON TRAPS; FOG CENTERS; POSITIVE HOLE TRAPS; SULFUR SENSITIZATION CENTERS;

PHOTOGRAPHIC EMULSIONS;

EID: 0032027365 PISSN: 10623701 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (19)

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