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Volumn , Issue 2, 1998, Pages 6-18
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Laser interferometric thermometry of semiconductors and dielectrics
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA PROCESSING;
DIELECTRIC MATERIALS;
FABRY-PEROT INTERFEROMETERS;
LASER APPLICATIONS;
SEMICONDUCTOR MATERIALS;
SENSITIVITY ANALYSIS;
LASER THERMOMETRY;
TEMPERATURE MEASUREMENT;
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EID: 0032026726
PISSN: 00328235
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (0)
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