Quantitative comparison of transmission electron microscopy techniques for the study of localized ordering on a nanoscale

Journal of the American Ceramic Society

Volumn 81, Issue 3, 1998, Pages 597-605

  Pan, Xiaoqing ^a,c,d   Kaplan, Wayne D ^a,c,e   Rühle, Manfred ^a,c   Newnham, Robert E ^b,c  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c AMERICAN CERAMIC SOCIETY   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

^e TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; DOPING (ADDITIVES); FERROELECTRIC MATERIALS; IMAGE PROCESSING; LANTHANUM; LEAD COMPOUNDS; MOLECULAR STRUCTURE; ORDER DISORDER TRANSITIONS; PEROVSKITE; SIZE DETERMINATION; TRANSMISSION ELECTRON MICROSCOPY;

LEAD MAGNESIUM NIOBATE;

CERAMIC MATERIALS;

EID: 0032026387     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02379.x     Document Type: Review

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