Dynamic fault dictionaries and two-stage fault isolation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 6, Issue 1, 1998, Pages 176-180

  Ryan, Paul G ^a   Fuchs, W Kent ^b  

^a INTEL CORPORATION   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

CAD; Diagnosis; Dynamic fault dictionaries; Fault isolation; Testing

Indexed keywords

COMPUTER AIDED DESIGN; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

DYNAMIC FAULT DICTIONARIES; FAULT ISOLATION;

VLSI CIRCUITS;

EID: 0032025512     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.661261     Document Type: Article

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