Microstructure characterization of one-directionally oriented ulexite

Journal of Materials Research

Volumn 13, Issue 3, 1998, Pages 778-783

  Ikuhara, Yumi H ^a   Kondoh, Shinji ^a   Kikuta, Koichi ^b   Hirano, Shin Ichi ^c  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CONTACT ANGLE; CRYSTAL MICROSTRUCTURE; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; LIGHT TRANSMISSION; MICROCRACKS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

BUNDLE STRUCTURE; COINCIDENCE BOUNDARIES; HIGH ANGLE GRAIN BOUNDARY; HIGH RESOLUTION ELECTRON MICROSCOPY; SMALL ANGLE GRAIN BOUNDARY; ULEXITE;

OPTICAL FIBERS;

EID: 0032025463     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0099     Document Type: Article

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