An X-ray study of the mixed-layered compounds of (GeTe)n (Sb2Te3)m homologous series

Journal of Alloys and Compounds

Volumn 268, Issue 1-2, 1998, Pages 112-117

  Karpinsky, O G ^a   Shelimova, L E ^a   Kretova, M A ^a   Fleurial, J P ^b  

^a BAIKOV INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Russian Federation)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Crystal structure; Germanium; Tellurium; X ray diffraction

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; DIFFRACTOMETERS; LATTICE CONSTANTS; PHASE COMPOSITION; SINGLE CRYSTALS; X RAY CRYSTALLOGRAPHY;

AUTOMATIC DIFFRACTOMETERS;

GERMANIUM COMPOUNDS;

EID: 0032024559     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(97)00625-7     Document Type: Article

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