Observation of “photon-assisted” shot noise in a phase-coherent conductor

Physical Review Letters

Volumn 80, Issue 11, 1998, Pages 2437-2440

  Schoelkopf, R J ^a   Kozhevnikov, A A ^a   Prober, D E ^a   Rooks, M J ^b  

^a YALE UNIVERSITY   (United States)

^b Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRIC WIRE; ELECTRON ENERGY LEVELS; ELECTRON TUNNELING; HIGH ELECTRON MOBILITY TRANSISTORS; MICROWAVES; PHOTONS; SIGNAL NOISE MEASUREMENT;

BESSEL FUNCTIONS; LINEAR SYSTEM; MONOCHROMATIC MICROWAVES; NONEQUILIBRIUM NOISE;

SHOT NOISE;

EID: 0032024544     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.2437     Document Type: Article

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