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Volumn 31, Issue 3, 1998, Pages 69-76

Managing conflict in system diagnosis

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SYSTEM RECOVERY; COMPUTER SYSTEMS PROGRAMMING;

EID: 0032024509     PISSN: 00189162     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/2.660192     Document Type: Review
Times cited : (5)

References (11)
  • 4
    • 0001655091 scopus 로고
    • A Generalization of Bayesian Inference
    • Series B
    • A.P. Dempster, "A Generalization of Bayesian Inference," J. Royal Statistical Society, Series B, 1968, pp. 205-247.
    • (1968) J. Royal Statistical Society , pp. 205-247
    • Dempster, A.P.1
  • 6
    • 57749183282 scopus 로고
    • Multiple Failure Diagnosis
    • IEEE Press, New York
    • J.W. Sheppard and W.R. Simpson, "Multiple Failure Diagnosis," Proc. Autotestcon, IEEE Press, New York, 1994, pp. 381-389.
    • (1994) Proc. Autotestcon , pp. 381-389
    • Sheppard, J.W.1    Simpson, W.R.2
  • 8
    • 0029771964 scopus 로고    scopus 로고
    • Maintaining Diagnostic Truth with Information Flow Models
    • IEEE Press, New York
    • J.W. Sheppard, "Maintaining Diagnostic Truth with Information Flow Models," Proc. Autotestcon, IEEE Press, New York, 1996, pp. 447-454.
    • (1996) Proc. Autotestcon , pp. 447-454
    • Sheppard, J.W.1
  • 9
    • 0029727306 scopus 로고    scopus 로고
    • An Experiment in Encapsulation in System Diagnosis
    • IEEE Press, New York
    • D. Gartner and J. Sheppard, "An Experiment in Encapsulation in System Diagnosis," Proc. Autotestcon, IEEE Press, New York, 1996, pp. 468-472.
    • (1996) Proc. Autotestcon , pp. 468-472
    • Gartner, D.1    Sheppard, J.2
  • 10
    • 84889212964 scopus 로고
    • Diagnosing Multiple Faults
    • J. deKleer, "Diagnosing Multiple Faults," Artificial Intelligence, Vol. 28, 987, pp. 163-196.
    • (1987) Artificial Intelligence , vol.28 , pp. 163-196
    • DeKleer, J.1
  • 11
    • 0029472598 scopus 로고
    • Sequential Test Strategies for Multiple Fault Isolation
    • IEEE Press, New York
    • M. Shakeri et al., "Sequential Test Strategies for Multiple Fault Isolation," Proc. Autotestcon, IEEE Press, New York, 1995, pp. 512-527.
    • (1995) Proc. Autotestcon , pp. 512-527
    • Shakeri, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.