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Volumn 53, Issue 3, 1998, Pages 399-406

Standardization of time-of-flight laser ionization mass spectrometry analysis of minerals

Author keywords

Laser ablation; Laser postionization; Mineral surface analysis; Quantitative analysis; Time of flight mass spectrometry

Indexed keywords

IONIZATION OF SOLIDS; LASER ABLATION; MINERALS; STANDARDIZATION;

MINERAL SURFACE ANALYSIS; TIME-OF-FLIGHT LASER IONIZATION MASS SPECTROMETRY (TOF LIMS);

MASS SPECTROMETRY;

EID: 0032023609 PISSN: 05848547 EISSN: None Source Type: Journal
DOI: 10.1016/s0584-8547(98)00081-0 Document Type: Article

Times cited : (11)

References (14)

1
- 0001245057
- S.L. Chryssoulis, K.G. Stove, F. Reich., Trans. Instn. Min. Metall. 101 (1992) 1.
- (1992) Trans. Instn. Min. Metall. , vol.101 , pp. 1
- Chryssoulis, S.L.¹ Stove, K.G.² Reich, F.³

2
- 0027789101
- M.E. Fleet, S.L. Chryssoulis, P.J. MacLean, R. Davidson, C.G. Weisener, The Canadian Mineralogist 31 (1993) 1.
- (1993) The Canadian Mineralogist , vol.31 , pp. 1
- Fleet, M.E.¹ Chryssoulis, S.L.² MacLean, P.J.³ Davidson, R.⁴ Weisener, C.G.⁵

3
- 0347554180
- S.L. Chryssoulis, J. Y. Kim, K.G. Stowe, in: Proceedings of the 26th Annual Conference of the Canadian Mineral Processors, vol. 28, 1994.
- Proceedings of the 26th Annual Conference of the Canadian Mineral Processors , vol.28 , pp. 1994
- Chryssoulis, S.L.¹ Kim, J.Y.² Stowe, K.G.³

4
- 0348183691
- J.Y. Kim, S.L. Chryssoulis, Minerals and Metallurgical Processing 69 (1996) XX.
- (1996) Minerals and Metallurgical Processing , vol.69
- Kim, J.Y.¹ Chryssoulis, S.L.²

5
- 0346293002
- CRC Press, Boca Raton, FL
- R. Kaufmann, P. Wieser, in: Modern Methods of Fine Particles Characterization, vol. III, CRC Press, Boca Raton, FL. 1982.
- (1982) Modern Methods of Fine Particles Characterization , vol.3
- Kaufmann, R.¹ Wieser, P.²

6
- 0003109239
- D.S. Simons, Int. J. Mass Spectrom. Ion Processes 55 (1984) 15.
- (1984) Int. J. Mass Spectrom. Ion Processes , vol.55 , pp. 15
- Simons, D.S.¹

7
- 0023453462
- R.W. Odom, B. Schueler, Thin Solid Films 154 (1987) 1.
- (1987) Thin Solid Films , vol.154 , pp. 1
- Odom, R.W.¹ Schueler, B.²

8
- 0041763262
- I.S. Borthwick, K.W.D. Ledingham, R.P. Singhal, R. Zheng, M. Campbell, Spectrochimica Acta B 51 (1996) 127.
- (1996) Spectrochimica Acta B , vol.51 , pp. 127
- Borthwick, I.S.¹ Ledingham, K.W.D.² Singhal, R.P.³ Zheng, R.⁴ Campbell, M.⁵

9
- 0348183688
- F. Adams (Ed.), John Wiley, ch. 5, and references within
- A.H. Verbueken, F.J. Bruynseels, R. Van Grieken, F. Adams, in: F. Adams (Ed.), Inorganic Mass Spectrometry, John Wiley, 1989, ch. 5, and references within.
- (1989) Inorganic Mass Spectrometry
- Verbueken, A.H.¹ Bruynseels, F.J.² Van Grieken, R.³ Adams, F.⁴

10
- 0347554147
- Academic Press, New York
- J. Morellec, D. Normand, G. Petite, Advances in Atomic and Molecular Physics, Academic Press, New York. 1982, p. 27.
- (1982) Advances in Atomic and Molecular Physics , pp. 27
- Morellec, J.¹ Normand, D.² Petite, G.³

11
- 0023978453
- B. Spengler, U. Bahr, M. Karas, F. Hillenkamp, Analytical Instrumentation 17 (1988) 173.
- (1988) Analytical Instrumentation , vol.17 , pp. 173
- Spengler, B.¹ Bahr, U.² Karas, M.³ Hillenkamp, F.⁴

12
- 0003818253
- D. Lubman (Ed.), Oxford University Press, New York, ch. 5
- R.W. Odom, B. Schueler, in: D. Lubman (Ed.), Lasers and Mass Spectrometry, Oxford University Press, New York, 1990, ch. 5.
- (1990) Lasers and Mass Spectrometry
- Odom, R.W.¹ Schueler, B.²

13
- 0021504248
- M.J. Southon, M.C. Witt, A. Harris, E.R. Wallach, J. Myatt, Vacuum 34 (1984) 903.
- (1984) Vacuum , vol.34 , pp. 903
- Southon, M.J.¹ Witt, M.C.² Harris, A.³ Wallach, E.R.⁴ Myatt, J.⁵

14
- 0348183692
- John Wiley, Chichester
- S.S. Dimov, S.L. Chryssoulis, in: Proceedings of the 10th SIMS International Conference, John Wiley, Chichester, 1996, p. 929.
- (1996) Proceedings of the 10th SIMS International Conference , pp. 929
- Dimov, S.S.¹ Chryssoulis, S.L.²

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