Correlation between the domain structure and ferroelectricity in PbTiO3 thin films

Materials Letters

Volumn 34, Issue 3-6, 1998, Pages 308-311

  Byun, Chulsoo ^a,b   Jang, Jin Wook ^c   Lee, Byong Whi ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Industrial Technology   (South Korea)

^c Seoul National University   (South Korea)

Author keywords

Curie temperature; Domain; Ferroelectricity; PbTiO3; Perovskite; Post annealing

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; FERROELECTRICITY; HYSTERESIS; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PEROVSKITE; PLATINUM; SILICA; SILICON; SUBSTRATES; THIN FILMS;

CAPACITANCE VOLTAGE CHARACTERISTICS; CURIE TEMPERATURE; DOMAIN WALL STRUCTURE; LEAD TITANATE;

DIELECTRIC FILMS;

EID: 0032023402     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(97)00188-2     Document Type: Article

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