Texture development in Bi2Te3 during hot forging

Journal of Materials Research

Volumn 13, Issue 3, 1998, Pages 766-773

  Gonzalez, E J ^a   Blendell, J E ^a   Cline, J P ^a   Ritter, J J ^a   Maruthamuthu, P ^b   Nelson, E H ^c   Horn, S B ^d  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MADRAS   (India)

^c U S ARMY RESEARCH LABORATORY   (United States)

^d NIGHT VISION AND ELECTRONIC SENSORS DIRECTORATE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; FORGING; PHYSICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; TEXTURES; THERMAL CONDUCTIVITY; X RAY DIFFRACTION;

MARCH-DOLLASE MODEL; RIETVELD ANALYSIS; SEEBECK COEFFICIENT;

BISMUTH ALLOYS;

EID: 0032023380     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0097     Document Type: Article

References (14)

1. W. M. Yim, E. V. Fitzke, and F. D. Rosi, J. Mater. Sci. 1, 52-65 (1966).
2. S. Nakajima, J. Phys. Chem. Solids 24, 479-485 (1962).
3. H. J. Goldsmid, Thermoelectric Refrigeration (Plenum Press, New York, 1964), p. 109.
4. H. Wada, T. Sat, K. Takahashi, and N. Nakastukasa, J. Mater. Res. 5, 1052-1057 (1990).
5. F. K. Lotgering, J. Inorg. Nucl. Chem. 9, 113 (1959).
6. I. J. Ohsugi, T. Kojima, and I. A. Nishida, J. Appl. Phys. 68 (11), 5692-5695 (1990).
7. J. J. Ritter, Inorg. Chem. 33, 6419 (1994).
8. W. A. Dollase, J. Appl. Cryst. 19, 267-272 (1986).
9. R. A. Young, The Rietveld Method, edited by R. A. Young (Oxford University Press, Oxford, 1993).
10. A. C. Larson and R. B. Von Dreele; General Structure Analysis System, Rietveld Analysis Software, LANSCE, MS-H805, Los Alamos National Laboratory, NM 87545.
11. Powder Diffraction File (PDF), ICDD, Newton Square Corporate Campus, 12 Campus Blvd., Newton Square, PA 19073-3273.
12. M. H. Francombe, Brit. J. Appl. Phys. 9, 415-417 (1958).
13. S. Nakajima, J. Phys. Chem. Solids, 24, 479-485 (1963).
14. E. J. Gonzalez and G. White, unpublished work.