Reciprocity of the bidirectional reflectance distribution function (BRDF) in measurements and models of structured surfaces

IEEE Transactions on Geoscience and Remote Sensing

Volumn 36, Issue 2, 1998, Pages 685-691

  Snyder, William C ^a  

^a GDE Systems Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; FUNCTIONS; MATHEMATICAL MODELS; PLANTS (BOTANY); RADIOMETRY; SURFACE PROPERTIES; SURFACE ROUGHNESS;

BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION (BRDF);

REMOTE SENSING;

EID: 0032022863     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/36.662750     Document Type: Article

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