Processing and hardness of single crystal Al2O3 films containing nano-ZrO2 inclusions produced by chemical solution deposition

Physica Status Solidi (A) Applied Research

Volumn 166, Issue 1, 1998, Pages 231-240

  McNally, F ^a   Lange, F F ^a   Marshall, D B ^a,b  

^a University of California   (United States)

^b ROCKWELL SCIENCE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; INCLUSIONS; METALLIC FILMS; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; POWDER METALS; PYROLYSIS; SINGLE CRYSTALS; SOLUTIONS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

ALUMINUM NITRATE; ZIRCONIUM NITRATE;

ALUMINA;

EID: 0032022673     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199803)166:1<231::AID-PSSA231>3.0.CO;2-E     Document Type: Article

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