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Volumn 31, Issue 6, 1998, Pages 600-601

Energy dissipation rate of a sample-induced thermal fluctuating field in the tip of a probe microscope

Author keywords

[No Author keywords available]

Indexed keywords

THERMAL ELECTROMAGNETIC FIELDS;

EID: 0032021499     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/31/6/004     Document Type: Article
Times cited : (35)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.