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Volumn 31, Issue 6, 1998, Pages 600-601
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Energy dissipation rate of a sample-induced thermal fluctuating field in the tip of a probe microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
THERMAL ELECTROMAGNETIC FIELDS;
ELECTRODYNAMICS;
ENERGY DISSIPATION;
MICROSCOPES;
PROBES;
ELECTROMAGNETIC FIELDS;
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EID: 0032021499
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/31/6/004 Document Type: Article |
Times cited : (35)
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References (3)
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