The dependence of the strain effects on the CdTe layer thicknesses in CdTe/GaAs heterostructures

Solid State Communications

Volumn 105, Issue 11, 1998, Pages 709-712

  Han, M S ^a   Kang, T W ^a   Kim, T W ^b  

^a Dongguk University   (South Korea)

^b Kwangwoon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; STRAIN;

ABSORPTION PEAK; CRITICAL POINT ENERGY SHIFT; LAYER THICKNESS DEPENDENCE; PHOTOREFLECTANCE; SPLITTING ENERGY; STRAIN EFFECT;

HETEROJUNCTIONS;

EID: 0032021027     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(97)10216-2     Document Type: Article

References (15)

1. Srinivasa, R., Panish, M.B. and Temkin, H., Appl. Phys. Lett., 50, 1987, 1441.
2. Nishitani, K., Okhata, R. and Murotani, T., J. Electron. Mater., 12, 1989, 619.
3. Hsu, C., Sivananthan, S., Chu, X. and Faurie, J.P., Appl. Phys. Lett., 48, 1986, 908.
4. Bicknell, R.N., Yanka, R.W., Giles, N.C., Schetzina, J.F., Magee, T.J., Leung, C. and Kawayoshi, H., Appl. Phys. Lett., 44, 1984, 313.
5. Zhonghai, Yu, Hofer, S.G., Giles, N.C. and Myers, T.H., Phys. Rev., B51, 1995, 13789.
6. Olego, D.J., Petruzzello, J., Ghandhi, S.K., Taskar, N.R. and Baht, I.B., Appl. Phys. Lett., 51, 1987, 127.
7. Svob, L., Marfaing, Y., Clerjaud, B., Cote, D., Lebkiri, A. and Druilhe, R., J. Crystal Growth, 159, 1996, 72.
8. Petruzzello, J., Olego, D., Chu, X. and Faune, J.P., J. Appl. Phys., 66, 1987, 2980.
9. Bahir, G., Ariel, V., Garber, V., Rosenfeld, D. and Sher, A., Appl. Phys. Lett., 65, 1994, 2725.
10. Tatsuoka, H., Kuwabara, H., Nakanishi, Y. and Fujiyasu, H., J. Appl. Phys., 68, 1990, 4592.
11. Bourret, A. and Fuoss, P.H., Appl. Phys. Lett., 61, 1992, 1034.
12. Bourret, A., Fuoss, P., Feuillet, G. and Tatarenko, S., Phys. Rev. Lett., 70, 1993, 311.
13. Bratina, G., Sorba, L., Antonini, A., Ceccone, G., Nicolini, R., Biasiol, G., Franciosi, A., Angelo, J.E. and Gerberich, W.W., Phys. Rev., B48, 1993, 8899.
14. Coquillat, D., Hamdani, F., Lascaray, J.P., Briot, O. and Aulombard, R.L., Phys. Rev., B47, 1993, 10489.
15. Kim, M.D., Kang, T.W., Han, M.S. and Kim, T.W., Jpn. J. Appl. Phys., 35, 1996, 4220.