Extremely thin silicon ΔE detectors for ion beam analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 616-622

  Whitlow, Harry J ^a   Winzell, Thomas ^a   Thungström, Göran ^b  

^a LUND INSTITUTE OF TECHNOLOGY   (Sweden)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Accelerator mass spectrometry; Elastic recoil detection; Energy loss; Integrated detectors; Nuclear reaction analysis; Particle identification; Self supporting membranes; Si p i n diodes; Straggling; E detectors

Indexed keywords

ENERGY DISSIPATION; ION BEAMS; MASS SPECTROMETRY; NANOTECHNOLOGY; READOUT SYSTEMS; SEMICONDUCTOR DIODES; SILICON SENSORS; STORAGE RINGS; TELESCOPES;

ACCELERATOR MASS SPECTROMETRY (AMS); ELASTIC RECOIL DETECTION ANALYSIS (ERDA); ION BEAM ANALYSIS; NUCLEAR REACTION ANALYSIS; PARTICLE IDENTIFICATION;

PARTICLE DETECTORS;

EID: 0032020657     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00875-6     Document Type: Article

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