Energy straggling induced errors in heavy-ion PIXE analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 179-183

  Tadic, T ^a,b   Mokuno, Y ^a   Horino, Y ^a   Fujii, K ^a   Jaksic, M ^b  

^a OSAKA NATIONAL RESEARCH INSTITUTE   (Japan)

^b RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

ECPSSR; Heavy ion; K lines; PIXE; Straggling

Indexed keywords

COMPUTATIONAL METHODS; ELECTROMAGNETIC WAVE EMISSION; ION BEAMS; IONIZATION; MATHEMATICAL MODELS; NUMERICAL METHODS; PROTONS;

ENERGY STRAGGLING; PROTON INDUCED X RAY EMISSION ANALYSIS; YANG MODEL;

X RAY SPECTROSCOPY;

EID: 0032020296     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00673-3     Document Type: Article

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