Ion-detectors for TOF mass analyzers

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 1244-1247

  Gonin, M ^a   Chen, Y H ^a   Horvath, Th ^a   Theiss, M ^a   Wollnik, H ^a  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IONS; MASS SPECTROMETRY; SIGNAL TO NOISE RATIO;

TIME OF FLIGHT MASS SPECTROMETRY (TOF MS);

PARTICLE DETECTORS;

EID: 0032019469     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00823-9     Document Type: Article

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