Standing waves and Kossel line patterns in structure determination

Solid State Communications

Volumn 105, Issue 11, 1998, Pages 685-687

  Marchesini, S ^a   Belakhovsky, M ^a   Baron, A Q R ^b   Faigel, G ^c   Tegze, M ^c   Kamp, P ^a  

^a CEA GRENOBLE   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

Author keywords

C. crystal structure and symmetry; C. X ray scattering; E. synchrotron radiation

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CRYSTAL SYMMETRY; LATTICE CONSTANTS; NICKEL COMPOUNDS; SYNCHROTRON RADIATION; X RAY SCATTERING;

KOSSEL LINE PATTERN; X RAY STANDING WAVE METHOD;

CRYSTALS;

EID: 0032018657     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(97)10214-9     Document Type: Article

References (16)

1. Kossel, W., Loeck, V. and Voges, H., Z. Phys., 94, 1935, 139.
2. von Laue, M., Roentgenstrahl-interferenzen (Akademische Verlag, Frankfurt 1960) p. 430 (in German); James, R.W., The Optical Principles of the Diffraction of X-rays (G. Bell and Sons, London, 1948) p. 438.
3. von Laue, M., Roentgenstrahl-interferenzen (Akademische Verlag, Frankfurt 1960) p. 430 (in German); James, R.W., The Optical Principles of the Diffraction of X-rays (G. Bell and Sons, London, 1948) p. 438.
4. Hutton, J.T., Trammell, G.T. and Hannon, J.P., Phys. Rev., B31, 1985, 743.
5. Takahashi, T. and Takahasi, M., Jpn. J. Phys., 32, 1993, 5159.
6. Gog, T., Novikov, D., Falta, J. and Materlik, G., J. de Physique III., 4, 1994, C9-449.
7. Ulrich, H.J. et al., Nucl. Instr. and Method, A349, 1994, 269.
8. Golovchenko, J. et al., Phys. Rev., B10, 1974, 4239.
9. Bedzyk, M.J. and Materlik, G., Phys. Rev., B32, 1985, 6456.
10. Comin, F. et al., Journal de Physique IV, 7, 1997, 343.
11. Freund, A.K., Munkholm, A. and Breman, S., SPIE, 2856, 1996, 68.
12. Baron, A., Ruffer, R. and Metge, J., Nucl. Instr. and Meth. A., 400, 1997, 124.
13. Tegze, M. and Faigel, G., Europhys. Lett., 16, 1991, 41.
14. The background comes from elastic and inelastic scattering of the incident beam by the electrons. Since none of these processes change the direction of polarization, this shows up as a double peak structure when scanning the analyzer crystal.
15. To get the orientation of the sample we used our own software. However, other well known codes like DIRAX etc. can also be used.
16. In this simple case (f.c.c. lattice) one can easily index without any sophisticated software. However, indexing also can be done by any standard powder indexing program like TREOR etc.