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Volumn 136-138, Issue , 1998, Pages 649-653

Limitations to depth resolution in high-energy, heavy-ion elastic recoil detection analysis

Author keywords

Depth resolution; Elastic recoil detection analysis; Ion beam analysis

Indexed keywords

ALUMINUM; COBALT; GOLD; ION BOMBARDMENT; IONIZATION CHAMBERS; METALLIC FILMS; THIN FILMS;

EID: 0032017649     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00879-3     Document Type: Article
Times cited : (10)

References (13)
  • 12
    • 0042508135 scopus 로고    scopus 로고
    • supplied by Computer Graphic Service, Ithaca, New York. OS/2 beta-test version supplied by Cornell University
    • RUMP ion scattering analysis package supplied by Computer Graphic Service, Ithaca, New York. (OS/2 beta-test version supplied by M.O. Thompson, Cornell University.).
    • RUMP Ion Scattering Analysis Package
    • Thompson, M.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.