|
Volumn 136-138, Issue , 1998, Pages
|
Proceedings of the 1997 13th International Conference on Ion Beam Analysis
[No Author Info available]
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRON ENERGY LOSS SPECTROSCOPY;
FISSION REACTIONS;
FUSION REACTIONS;
GAMMA RAYS;
INTERFACES (MATERIALS);
ION BOMBARDMENT;
IONIZATION;
MULTILAYERS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING FILMS;
THIN FILMS;
X RAY SPECTROGRAPHS;
EIREV;
ELECTRONIC STOPPING POWER;
ION BEAM ANALYSIS;
IONIZATION CROSS SECTIONS;
LOW ENERGY ION BACKSCATTERING SPECTROMETRY;
NUCLEAR MICROPROBES;
NUCLEAR REACTIONS CROSS SECTIONS;
PARTICLE INDUCED GAMMA RAY EMISSION (PIGE) ANALYSIS;
PARTICLE INDUCED X RAY EMISSION (PIXE) ANALYSIS;
PROTON ELASTIC SCATTERING CROSS SECTIONS;
ION BEAMS;
|
EID: 0032017513
PISSN: 0168583X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
Times cited : (6)
|
References (0)
|