Depth resolution and dynamic range of 18O(p,α)15N depth profiling

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 1306-1311

  Liu, J R ^a   Li, Y P ^a   Chen, Q Y ^a   Cui, X T ^a   Christoffersen, R ^a   Jacobson, A ^a   Chu, W K ^a  

^a UNIVERSITY OF HOUSTON   (United States)

Author keywords

Ion beam analysis; NRA; Nuclear reaction analysis; Oxide

Indexed keywords

ALPHA PARTICLES; ANNEALING; DIFFUSION IN SOLIDS; HIGH TEMPERATURE EFFECTS; ION BEAMS; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; YTTRIUM; ZIRCONIA;

NUCLEAR REACTION ANALYSIS; STRONTIUM TITANATE;

OXYGEN;

EID: 0032017489     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00835-5     Document Type: Article

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