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Volumn 136-138, Issue , 1998, Pages 1312-1321

RBS and PIXE study of gallium depth profiling in ZSM-5 gallo-aluminosilicate zeolites

Author keywords

Catalysis; Depth profiling; Ga ZSM 5; Gallium migration; Gallo aluminosilicates; PIXE; RBS; Thermal treatment; Zeolites

Indexed keywords

ALUMINUM COMPOUNDS; AMINES; CALCINATION; CATALYSIS; CRYSTAL LATTICES; GALLIUM; GELS; HEAT TREATMENT; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SYNTHESIS (CHEMICAL);

EID: 0032017477     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00827-6     Document Type: Article
Times cited : (5)

References (63)
  • 6
    • 0042409899 scopus 로고    scopus 로고
    • P. Meriaudeau, G. Sapaly, C. Naccache, in Ref. [2], p. 1423
    • P. Meriaudeau, G. Sapaly, C. Naccache, in Ref. [2], p. 1423.
  • 53
    • 0041407556 scopus 로고
    • Ph.D. Thesis, University of Mulhouse, France
    • A. Seive, Ph.D. Thesis, University of Mulhouse, France, 1989.
    • (1989)
    • Seive, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.