Electromigration in single-crystal aluminum lines with fast diffusion paths made by nanoindentation

Acta Materialia

Volumn 46, Issue 6, 1998, Pages 1969-1979

  Joo, Young Chang ^a   Baker, S P ^a   Arzt, E ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL ORIENTATION; CURRENT DENSITY; DIFFUSION IN SOLIDS; ELECTRIC CONDUCTORS; ELECTROMIGRATION; NANOTECHNOLOGY; NUCLEATION; PLASTIC DEFORMATION; SINGLE CRYSTALS; SUBSTRATES;

NANOINDENTATION;

ALUMINUM;

EID: 0032010569     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(97)00427-8     Document Type: Article

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