High resolution electron microscopy investigations of interface and other structure defects in some ceramics

Microscopy Research and Technique

Volumn 40, Issue 3, 1998, Pages 177-186

  Wen, Shulin ^a,b   Liu, Qian ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Bioceramics; Ceramics; Electron microscopy; Fullerene; High Tc superconductors; High resolution electron microscopy; Human enamel; Hydroxyapatite; Sialon; Silicon nitride

Indexed keywords

BISMUTH COMPOUNDS; CERAMIC MATERIALS; COPPER COMPOUNDS; CRYSTAL ATOMIC STRUCTURE; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; HYDROXYAPATITE; POINT DEFECTS;

ATOMIC LEVELS; CERAMIC; GRAIN-BOUNDARIES; HIGH TC SUPERCONDUCTORS; HUMAN ENAMEL; PROPERTY; SIALON; STRUCTURE DEFECTS; STRUCTURE FEATURES; Α-SIALON;

SILICON NITRIDE;

APATITE; FULLERENE DERIVATIVE; HYDROXYAPATITE;

ARTICLE; CERAMICS; CONDUCTOR; ELECTRON MICROSCOPY; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 0032006931     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19980201)40:3<177::AID-JEMT2>3.0.CO;2-S     Document Type: Article

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