The realism of FAA reliability-safety requirements and alternatives

IEEE Aerospace and Electronic Systems Magazine

Volumn 13, Issue 2, 1998, Pages 16-20

  Pecht, Michael ^a,j   Boullie, Julian ^b,k   Hakim, Edward ^c   Jain, Aridaman K ^d,l   Jackson, Margaret ^e   Knowles, Ian ^f   Schroeder, Rick ^g   Strange, Alan D ^h   Wyler, John ^i,m  

^a UNIVERSITY OF MARYLAND   (United States)

^b Aerospatiale   (France)

^c U S ARMY RESEARCH LABORATORY   (United States)

^d Bell Labs Innovations Lucent T   (United States)

^e NORTHROP GRUMMAN CORPORATION   (United States)

^f MINISTRY OF DEFENCE   (United Kingdom)

^g Rockwell International   (United States)

^h BAE SYSTEMS   (United Kingdom)

ⁱ Smiths Industries ^*  (United States)

^j UNIVERSITY OF MARYLAND   (United States)

^k Aerospatiale   (France)

^l LUCENT TECHNOLOGIES   (United States)

^m Smiths Industries   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ACCIDENT PREVENTION; RELIABILITY; STANDARDS;

FLIGHT CRITICAL SYSTEMS;

AVIONICS;

EID: 0032003194     PISSN: 08858985     EISSN: None     Source Type: Journal    
DOI: 10.1109/62.656329     Document Type: Article

References (10)

1. FAA Advisory Circular, 1988, System Design Analysis, 25.1309-1A.
2. AIA Member Companies, 1991, Ultra Reliable Electronic Systems, Failure Data Analysis by Committee of AIA member companies, pp. 5-7.
3. Leonard, C.T., 1989, How Failure Prediction Methodology Affects Electronic Equipment Design, in PCIM Proc., pp. 155-164.
4. MIL-HDBK-217F, 1997 Reliability Prediction of Electronic Equipment, US Department of Defense.
5. Kopanski, J.K., et al, 1991 June 16-20, Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits, First High Temperature Electronics Conference.
6. Westinghouse Electric Corp., 1989, Failure Analysis Memos.
7. Morris, Seymour, 1990, MIL-HDBK-217 Use and Application, Reliability Review" 10.
8. Army Memorandum from G. Dekker, 15 February 1996, Assistant Secretary for Research, Development, and Acquisition.
9. Pecht M. and Nash F., July 1994, Predicting the Reliability of Electronic Equipment, Proceedings of the IEEE, Vol. 82, 992-1004.
10. Pecht, M and V. Ramappan, 1992, Are Components Still the Major Problem: A Review of Electronic System and Device Field Failure Returns, IEEE Transactions on Components, Hybrids and Manufacturing Technology, Vol. 15(6), pp. 820-826.