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Volumn 21, Issue 1, 1998, Pages 28-34

Molded chip scale package for high pin count

Author keywords

Chip scale package; Known good die; Robust package; Screen printing; Solder bumping; Transfer molding; Wiring conductor pattern

Indexed keywords

ELECTRIC WIRING; INTEGRATED CIRCUIT MANUFACTURE; LSI CIRCUITS; PRINTED CIRCUIT BOARDS; SCREEN PRINTING; SOLDERING; TRANSFER MOLDING;

EID: 0032002770     PISSN: 10709894     EISSN: None     Source Type: Journal    
DOI: 10.1109/96.659503     Document Type: Article
Times cited : (5)

References (12)
  • 1
    • 0029218676 scopus 로고
    • Reliability investigations of fluxless flip-chip interconnections on green tape ceramic substrates
    • J. Kloeser, E. Zakel, F. Bechtold, and H. Reichl, "Reliability investigations of fluxless flip-chip interconnections on green tape ceramic substrates," in Proc. 45th ECTC, 1995, pp. 1179-1190.
    • (1995) Proc. 45th ECTC , pp. 1179-1190
    • Kloeser, J.1    Zakel, E.2    Bechtold, F.3    Reichl, H.4
  • 4
    • 0029218671 scopus 로고
    • Repairability of underfill encapsulated flip-chip packages
    • D. Suryanarayana, J. A. Varcoe, and J. V. Ellerson, "Repairability of underfill encapsulated flip-chip packages," in Proc. 45th ECTC, 1995, pp. 524-528.
    • (1995) Proc. 45th ECTC , pp. 524-528
    • Suryanarayana, D.1    Varcoe, J.A.2    Ellerson, J.V.3
  • 7
    • 0029229647 scopus 로고
    • Simple-structure, generally applicable chip-scale package
    • S. Matsuda, K. Kata, and E. Hagimoto, "Simple-structure, generally applicable chip-scale package," in Prac. 45th ECTC, 1995, pp. 218-223.
    • (1995) Prac. 45th ECTC , pp. 218-223
    • Matsuda, S.1    Kata, K.2    Hagimoto, E.3
  • 11
    • 0027746688 scopus 로고
    • A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test
    • Y. Uegai, S. Tani, A. Inoue, S. Yoshioka, and K. Tamura, "A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test," in Proc. ASME Int. Electron. Packag. Conf., 1993, pp. 493-498.
    • (1993) Proc. ASME Int. Electron. Packag. Conf. , pp. 493-498
    • Uegai, Y.1    Tani, S.2    Inoue, A.3    Yoshioka, S.4    Tamura, K.5
  • 12
    • 0029218855 scopus 로고
    • The effect of internal package delaminations on the thermal performance of PQFP, thermally enhanced PQFP, LOC, and BGA packages
    • D. Edwards, B. Stearns, and M. Helmick, "The effect of internal package delaminations on the thermal performance of PQFP, thermally enhanced PQFP, LOC, and BGA packages," in Proc. 45th ECTC, 1995, pp. 285-292.
    • (1995) Proc. 45th ECTC , pp. 285-292
    • Edwards, D.1    Stearns, B.2    Helmick, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.