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1
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0029218676
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Reliability investigations of fluxless flip-chip interconnections on green tape ceramic substrates
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J. Kloeser, E. Zakel, F. Bechtold, and H. Reichl, "Reliability investigations of fluxless flip-chip interconnections on green tape ceramic substrates," in Proc. 45th ECTC, 1995, pp. 1179-1190.
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(1995)
Proc. 45th ECTC
, pp. 1179-1190
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Kloeser, J.1
Zakel, E.2
Bechtold, F.3
Reichl, H.4
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2
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0028546264
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A bare-chip probe for high I/O, high speed testing
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A. Barber, K. Lee, and H. Obermaier, "A bare-chip probe for high I/O, high speed testing," IEEE Trans. Comp., Packag. Manufact. Technol., vol. 17, pp. 612-619, 1994.
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(1994)
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, vol.17
, pp. 612-619
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Barber, A.1
Lee, K.2
Obermaier, H.3
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3
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0029218846
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A novel elastonieric connector for packaging inter-connections, testing and burn-in applications
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D. Y. Shin, B. Beaman, P. Lauro, K. Fogel, M. Norcott, G. F. Walker, J. Hedrick, L. Shi, F. Doany, and J. Shaw, "A novel elastonieric connector for packaging inter-connections, testing and burn-in applications," in Proc. 45th ECTC, 1995, pp. 126-133.
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(1995)
Proc. 45th ECTC
, pp. 126-133
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Shin, D.Y.1
Beaman, B.2
Lauro, P.3
Fogel, K.4
Norcott, M.5
Walker, G.F.6
Hedrick, J.7
Shi, L.8
Doany, F.9
Shaw, J.10
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4
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0029218671
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Repairability of underfill encapsulated flip-chip packages
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D. Suryanarayana, J. A. Varcoe, and J. V. Ellerson, "Repairability of underfill encapsulated flip-chip packages," in Proc. 45th ECTC, 1995, pp. 524-528.
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(1995)
Proc. 45th ECTC
, pp. 524-528
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Suryanarayana, D.1
Varcoe, J.A.2
Ellerson, J.V.3
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5
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0029373414
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Chip scale package: A lightly dressed LSI chip
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M. Yasunaga, S. Baba, M. Matsuo, H. Matsushima, S. Nakao, and T. Tachikawa, "Chip scale package: A lightly dressed LSI chip," IEEE Trans. Comp., Packag. Manufact. Technol., vol. 18, pp. 451-457, 1995.
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(1995)
IEEE Trans. Comp., Packag. Manufact. Technol.
, vol.18
, pp. 451-457
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Yasunaga, M.1
Baba, S.2
Matsuo, M.3
Matsushima, H.4
Nakao, S.5
Tachikawa, T.6
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6
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0029509504
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The resin molded chip size package (MCSP)
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S. Tanigawa, K. Igarashi, M. Nagasawa, and N. Yoshio, "The resin molded chip size package (MCSP)," in Proc. IEEE/CPMT IEMT Symp., 1995, pp. 410-415.
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(1995)
Proc. IEEE/CPMT IEMT Symp.
, pp. 410-415
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Tanigawa, S.1
Igarashi, K.2
Nagasawa, M.3
Yoshio, N.4
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7
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0029229647
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Simple-structure, generally applicable chip-scale package
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S. Matsuda, K. Kata, and E. Hagimoto, "Simple-structure, generally applicable chip-scale package," in Prac. 45th ECTC, 1995, pp. 218-223.
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(1995)
Prac. 45th ECTC
, pp. 218-223
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Matsuda, S.1
Kata, K.2
Hagimoto, E.3
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8
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33749087698
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Studies of high pin count molded chip scale package
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Germany
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Y. Tomita, S. Baba, M. Matsuo, H. Matsushima, N. Ueda, and O. Nakagawa, "Studies of high pin count molded chip scale package," in Proc. Area Array Packag. Technol. Workshop Flip Chip Ball Grid Arrays, Germany, 1995.
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(1995)
Proc. Area Array Packag. Technol. Workshop Flip Chip Ball Grid Arrays
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Tomita, Y.1
Baba, S.2
Matsuo, M.3
Matsushima, H.4
Ueda, N.5
Nakagawa, O.6
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9
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33749089141
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Development of ball bumps making method with screen printing
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in Japanese
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J. Fujino, K. Murakami, Y. Morihiro, and S. Hoshinouchi, "Development of ball bumps making method with screen printing," in Proc. 1st. Symp. Microjoin. Assembly Technol. Electron., 1995, pp. 187-192, in Japanese.
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(1995)
Proc. 1st. Symp. Microjoin. Assembly Technol. Electron.
, pp. 187-192
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Fujino, J.1
Murakami, K.2
Morihiro, Y.3
Hoshinouchi, S.4
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10
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0029247092
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Reliability comparison of two metal-lurgies for ceramic ball grid array
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D. R. Banks, T. E. Burnrtte, R. D. Gerke, E. Mammo, and S. Mattay, "Reliability comparison of two metal-lurgies for ceramic ball grid array," IEEE Trans. Comp., Packag. Manufact. Technol., vol. 18, pp. 53-57, 1995.
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(1995)
IEEE Trans. Comp., Packag. Manufact. Technol.
, vol.18
, pp. 53-57
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-
Banks, D.R.1
Burnrtte, T.E.2
Gerke, R.D.3
Mammo, E.4
Mattay, S.5
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11
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0027746688
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A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test
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Y. Uegai, S. Tani, A. Inoue, S. Yoshioka, and K. Tamura, "A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test," in Proc. ASME Int. Electron. Packag. Conf., 1993, pp. 493-498.
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(1993)
Proc. ASME Int. Electron. Packag. Conf.
, pp. 493-498
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Uegai, Y.1
Tani, S.2
Inoue, A.3
Yoshioka, S.4
Tamura, K.5
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12
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0029218855
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The effect of internal package delaminations on the thermal performance of PQFP, thermally enhanced PQFP, LOC, and BGA packages
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D. Edwards, B. Stearns, and M. Helmick, "The effect of internal package delaminations on the thermal performance of PQFP, thermally enhanced PQFP, LOC, and BGA packages," in Proc. 45th ECTC, 1995, pp. 285-292.
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(1995)
Proc. 45th ECTC
, pp. 285-292
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Edwards, D.1
Stearns, B.2
Helmick, M.3
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