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Volumn 313-314, Issue , 1998, Pages 697-703
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In situ characterization of cubic boron nitride film growth in the IR spectral region
a b a b a |
Author keywords
Cubic boron nitride; In situ diagnostics; Polarized FTIR reflectometry; VIS ellipsometry
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Indexed keywords
CUBIC BORON NITRIDE;
DAMPING;
ELECTRODEPOSITION;
ELLIPSOMETRY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LATTICE VIBRATIONS;
LIGHT REFLECTION;
PHONONS;
PLASMA APPLICATIONS;
SPECTRUM ANALYSIS;
OSCILLATOR STRENGTH;
POLARIZED INFRARED REFLECTION SPECTROSCOPY;
FILM GROWTH;
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EID: 0032002335
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(97)00980-2 Document Type: Article |
Times cited : (10)
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References (20)
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