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Volumn 313-314, Issue , 1998, Pages 697-703

In situ characterization of cubic boron nitride film growth in the IR spectral region

Author keywords

Cubic boron nitride; In situ diagnostics; Polarized FTIR reflectometry; VIS ellipsometry

Indexed keywords

CUBIC BORON NITRIDE; DAMPING; ELECTRODEPOSITION; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LATTICE VIBRATIONS; LIGHT REFLECTION; PHONONS; PLASMA APPLICATIONS; SPECTRUM ANALYSIS;

EID: 0032002335     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00980-2     Document Type: Article
Times cited : (10)

References (20)
  • 6
    • 0025662649 scopus 로고
    • A. Lunk, Vacuum 41 (1990) 1965.
    • (1990) Vacuum , vol.41 , pp. 1965
    • Lunk, A.1
  • 11
    • 0347226297 scopus 로고    scopus 로고
    • to be published
    • A. Lunk et al., to be published.
    • Lunk, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.