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Volumn 33, Issue 2, 1998, Pages 253-258

Dual-period self-refresh scheme for low-power DRAM's with on-chip PROM mode register

Author keywords

DRAM; Period; PROM; Refresh; Register

Indexed keywords

DESIGN; PROM; SEMICONDUCTOR STORAGE; TECHNOLOGY;

EID: 0032001924     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.658627     Document Type: Article
Times cited : (28)

References (9)
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  • 3
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    • Battery operated 16 M DRAM with post package programmable and variable self refresh
    • D. C. Choi et al., "Battery operated 16 M DRAM with post package programmable and variable self refresh," in Symp. VLSI Circuits, Dig. Tech. Papers, 1994, pp. 83-84.
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  • 4
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    • Well concentration: A novel scaling limitation factor derived from DRAM retention time and its modeling
    • T. Hamamoto et al., "Well concentration: A novel scaling limitation factor derived from DRAM retention time and its modeling," in IEDM Tech. Dig., 1995, pp. 915-918.
    • (1995) IEDM Tech. Dig. , pp. 915-918
    • Hamamoto, T.1
  • 5
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    • Redundancy techniques for fast static RAM's
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    • (1991) ISSCC Dig. Tech. Papers , pp. 268-269
    • Kokkonen, K.1
  • 6
    • 0019624943 scopus 로고
    • Laser programmable redundancy and yield improvement in a 64 k DRAM
    • Oct.
    • R. T. Smith et al., "Laser programmable redundancy and yield improvement in a 64 k DRAM," IEEE J. Solid-State Circuits, vol. SC-16, pp. 506-514, Oct. 1981.
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  • 7
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    • Study of new refresh method for low data retention current
    • Y. Miyamoto et al., "Study of new refresh method for low data retention current," in Proc. 1993 IEICE Spring Conf., C-638.
    • Proc. 1993 IEICE Spring Conf.
    • Miyamoto, Y.1
  • 8
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    • A sub-0.5 mA/MB data-retention DRAM
    • H. Yamauchi et al., "A sub-0.5 mA/MB data-retention DRAM," in ISSCC Dig. Tech. Papers, 1995, pp. 244-245.
    • (1995) ISSCC Dig. Tech. Papers , pp. 244-245
    • Yamauchi, H.1
  • 9
    • 84943130890 scopus 로고
    • Single poly EEPROM cell structure for use in standard CMOS processes
    • Mar.
    • K. Ohsaki et al., "Single poly EEPROM cell structure for use in standard CMOS processes," IEEE J. Solid-State Circuits, vol. 29, pp. 311-316, Mar. 1994.
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    • Ohsaki, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.