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Volumn 44, Issue 2, 1998, Pages 117-126

Failure analysis of composite dielectric of power capacitors used in distribution systems

Author keywords

Composite dielectric; Failure analysis; Power capacitors; Power distribution systems

Indexed keywords

CAPACITORS; DIELECTRIC MATERIALS; ELECTRIC POWER DISTRIBUTION; FAILURE ANALYSIS; MATHEMATICAL MODELS; PARTIAL DISCHARGES; RELIABILITY THEORY; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

EID: 0032001533     PISSN: 03787796     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0378-7796(97)01191-7     Document Type: Article
Times cited : (10)

References (8)
  • 2
    • 0347945979 scopus 로고
    • Evaluating capacitor reliability
    • J. Lapp, Evaluating capacitor reliability, Electr. World, 192 (1978) 42-44.
    • (1978) Electr. World , vol.192 , pp. 42-44
    • Lapp, J.1
  • 3
    • 0018162104 scopus 로고
    • Dielectric properties of oil - Impregenated all polypropylene films, power capacitor insulation system
    • S. Yasufuku, T. Umemura, Y. Yasuda, Dielectric properties of oil - impregenated all polypropylene films, power capacitor insulation system, IEEE Trans. Elec. Insul., EI-13 6 (1978) 403-410.
    • (1978) IEEE Trans. Elec. Insul. , vol.6 EI-13 , pp. 403-410
    • Yasufuku, S.1    Umemura, T.2    Yasuda, Y.3
  • 4
    • 0022055562 scopus 로고
    • Characteristics of dielectric fluids for medium - Voltage power capacitors
    • C. A. Nucci, F. Tarroni, D. Zanobetti, Characteristics of dielectric fluids for medium - voltage power capacitors, IEEE Trans. Elec. Insul., EI-20 2 (1985) 423-426.
    • (1985) IEEE Trans. Elec. Insul. , vol.2 EI-20 , pp. 423-426
    • Nucci, C.A.1    Tarroni, F.2    Zanobetti, D.3
  • 5
    • 0019623161 scopus 로고
    • A changing capacitor technology failure mechanisms and design innovations
    • D.G. Shaw, S.W. Cichanowski, A. Yializis, A changing capacitor technology failure mechanisms and design innovations, IEEE Trans. Elec. Insul., EI-16, 5 (1981) 399-413.
    • (1981) IEEE Trans. Elec. Insul. , vol.5 EI-16 , pp. 399-413
    • Shaw, D.G.1    Cichanowski, S.W.2    Yializis, A.3
  • 6
    • 0022890034 scopus 로고
    • Diagnostic methods for capacitors
    • Y. Inoue, Y. Yoshida, Diagnostic methods for capacitors, IEEE Trans. Elec. Insul., EI-21 6 (1986) 1033-1036.
    • (1986) IEEE Trans. Elec. Insul. , vol.6 EI-21 , pp. 1033-1036
    • Inoue, Y.1    Yoshida, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.