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Volumn 37, Issue 2, 1998, Pages 709-714
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Controlled nitrogen incorporation at Si-SiO2 interfaces by remote plasma-assisted processing
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Author keywords
Auger electron spectroscopy; Chemical reaction pathways; Low temperature processing; Optical second harmonic generation; Plasma assisted oxidation and nitridation; Rapid thermal annealing; Si SiO2 interfaces
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
NITRIDING;
NITROGEN;
OXIDATION;
PLASMA APPLICATIONS;
REACTION KINETICS;
SECOND HARMONIC GENERATION;
SEMICONDUCTING SILICON;
SILICA;
PLASMA ASSISTED OXIDATION/NITRIDATION;
INTERFACES (MATERIALS);
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EID: 0032001146
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.37.709 Document Type: Article |
Times cited : (3)
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References (14)
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