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Volumn 37, Issue 2, 1998, Pages 709-714

Controlled nitrogen incorporation at Si-SiO2 interfaces by remote plasma-assisted processing

Author keywords

Auger electron spectroscopy; Chemical reaction pathways; Low temperature processing; Optical second harmonic generation; Plasma assisted oxidation and nitridation; Rapid thermal annealing; Si SiO2 interfaces

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; NITRIDING; NITROGEN; OXIDATION; PLASMA APPLICATIONS; REACTION KINETICS; SECOND HARMONIC GENERATION; SEMICONDUCTING SILICON; SILICA;

EID: 0032001146     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.709     Document Type: Article
Times cited : (3)

References (14)
  • 14
    • 11344295560 scopus 로고    scopus 로고
    • private communication
    • E. A. Irene: private communication.
    • Irene, E.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.