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Volumn 10, Issue 1-4, 1998, Pages 134-138

The composition changes induced by surface roughening and mixing during the ion profiling of multilayers

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; MULTILAYERS; SURFACE PHENOMENA;

EID: 0032001068     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0927-0256(97)00125-0     Document Type: Article
Times cited : (3)

References (12)
  • 6
    • 0009394004 scopus 로고
    • Materials and Processes for Surface and Interface Engineering
    • ed. Y. Pauleau, Kluwer Academic Publishers, Dordrecht
    • R. Kelly and A. Miotelo, in: Materials and Processes for Surface and Interface Engineering, ed. Y. Pauleau, NATO ASI Series, Vol. 290 (Kluwer Academic Publishers, Dordrecht, 1994) p. 67.
    • (1994) NATO ASI Series , vol.290 , pp. 67
    • Kelly, R.1    Miotelo, A.2
  • 9
    • 0003127709 scopus 로고
    • Sputtering by Particle Bombardment III
    • eds. R. Behrisch and K. Wittmark, Springer, Berlin
    • K. Wittmark, in: Sputtering by Particle Bombardment III, eds. R. Behrisch and K. Wittmark, Topics in Applied Physics, Vol. 64 (Springer, Berlin, 1991) p. 161.
    • (1991) Topics in Applied Physics , vol.64 , pp. 161
    • Wittmark, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.