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Volumn 165, Issue 2, 1998, Pages 461-465
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Semiconductor properties of polycrystalline CuBr by Hall effect and capacitive measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE MEASUREMENT;
CHARGE CARRIERS;
COPPER COMPOUNDS;
HALL EFFECT;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING COPPER COMPOUNDS;
SEMICONDUCTOR MATERIALS;
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EID: 0032000969
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-396X(199802)165:2<461::AID-PSSA461>3.0.CO;2-W Document Type: Article |
Times cited : (24)
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References (18)
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