Thermal monitoring of self-checking systems

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 12, Issue 1-2, 1998, Pages 81-92

  Szekely V ^a   Rencz, M ^a   Karam, J M ^b   Lubaszewski, M ^b   Courtois, B ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b TIMA LABORATORY   (France)

Author keywords

Self checking circuits; Temperature sensors; Thermal sensors; Thermal testing

Indexed keywords

DETECTOR CIRCUITS; SENSORS; TEMPERATURE MEASUREMENT;

DESIGN FOR THERMAL TESTABILITY (DFTT); SELF CHECKING CIRCUITS; THERMAL SENSORS; THERMAL TESTING;

INTEGRATED CIRCUIT LAYOUT;

EID: 0032000860     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008233907036     Document Type: Article

References (27)

1. H. Levendel, "On-line Testing and Diagnosis of Telecommunications Systems," Invited Talk at the 2nd On-line Testing Workshop, Biarritz, France, July 1996.
2. V. Székely, Cs. Márta, M. Rencz, Zs. Benedek, and B. Courtois, "Design for Thermal Testability (DFTT) and a CMOS Realization," 1st Therminic Workshop, Grenoble, France, Sept. 1995.
3. V. Székely and M. Rencz, "On-Line Thermal Testing of Microstructures," 4th Annual Atlantic Test Workshop ATW 95, Durham, New Hampshire, USA, May-June 1995, pp. 1-9.
4. M. Nicolaidis, "A Unified Built-In Self-Test Scheme: UBIST," Proc. 18th International Symposium on Fault Tolerant Computing, Tokyo, Japan, June 1988, pp. 157-163.
5. M. Nicolaidis, "Efficient UBIST Implementation for Microprocessor Sequencing Parts," Proc. 21st International Test Conference, Washington, USA, Sept. 1990, pp. 316-326.
6. S. Mir, M. Lubaszewski, V. Kolarik, and B. Courtois, "Analogue On-line/Off-line Test Unification for Fully Differential Circuits," 1st International Mixed-Signal Testing Workshop, Grenoble, France, June 1995.
7. J.-C. Lo, J. Daly, and M. Nicolaidis, "Static CMOS Self-Checking Circuits," Proc. 22nd International Symposium on Fault Tolerant Computing, Boston, USA, July 1992, pp. 104-111.
8. C. Maunder and R. Tulloss, The Test Access Port and Boundary Scan Architecture, IEEE Computer Society Press, Los Alamitos, USA, 1990.
9. M. Lubaszewski and B. Courtois, "On the Design of Self-Checking Boundary Scannable Boards," Proc. 23rd International Test Conference, Baltimore, USA, Sept. 1992, pp. 372-381.
10. J.W. Gardner, Microsensors, Principles and Applications, John Wiley & Sons, New York, USA, 1994.
11. R. Wolffenbuttel, "Fabrication Compatibility of Integrated Silicon Smart Physical Sensors," Sensors and Actuators, Vol. A41-A42, pp. 11-28, 1994.
12. B. van Oudheusden and J. Huijsing, "Integrated Flow Friction Sensor," Sensors and Actuators, Vol. 15, pp. 135-144, 1988.
13. V. Székely, "New Type of Thermal-Function IC: The 4-Quadrant Multiplier," Electronics Letters, Vol. 12, No. 15, pp. 372-373, 1976.
14. G. Meijer, "Thermal Sensors Based on Transistors," Sensors and Actuators, Vol. 10, pp. 103-125, 1986.
15. K. Szajda, C. Sodini, and H. Bowman, "A Low Noise High Resolution Silicon Temperature Sensor," Department of Electrical Engineering and Computer Science, Massachussetts Institute of Technology, Cambridge, USA.
16. P. Krummenacher and H. Oguey, "Smart Temperature Sensor in CMOS Technology," Sensors and Actuators, Vol. A21-A23, pp. 636-638, 1990.
17. P. Gray and R. Meyer, Analysis and Design of Analog Integrated Circuits, Second edition, John Wiley & Sons, New York, USA, 1984.
18. B. Hosticka, J. Fichtel, and G. Zimmer, "Integrated Monolithic Temperature Sensors for Acquisition and Regulation," Sensors and Actuators, Vol. 6, pp. 191-200, 1984.
19. S. Middelhoek and S.A. Audet, Silicon Sensors, Academic Press, London, U.K., 1989.
20. W. Wójciak and A. Napieralski, "An Analogue Temperature Sensor Integrated in The CMOS Technology," 1st THERMINIC Workshop, Grenoble, France, Sept. 1995, pp. 15-20.
21. W.M. Sansen, F. Op't Eynde, and M. Steyaert, "A CMOS Temperature Compensated Current Reference," IEEE Journal of Solid-State Circuits, Vol. 23, No. 3, pp. 821-824, 1988.
22. G.M. Quénot, N. Paris, and B. Zavidovique, "A Temperature and Voltage Measurement Cell for VLSI Circuits," EURO-ASIC'91, Paris, France, pp. 334-338, May 1991.
23. K. Arabi and B. Kaminska, "Oscillation Built-in Self-Test of Mixed-Signal IC With Temperature and Current Monitoring," 2nd IEEE Int. On-Line Testing Workshop, Biarritz, France, July 1996.
24. E. Montané, S.A. Bota, and J. Samitier, "A Compact Temperature Sensor of a 1.0 μm CMOS Technology Using Lateral PNP Transistors," Thermanic'96 Workshop, Budapest, Hungary, Sept. 1996, pp. 45-48.
25. A. Bakker and J.H. Huijsing, "Micropower CMOS Smart Temperature Sensor," ESSCIRC'95, Lille, France, pp. 238-241, Sept. 1995.
26. V. Székely, Cs. Márta, Zs. Kohári, and M. Rencz, "CMOS Sensors for On-Line Thermal Monitoring of VLSI Circuits," IEEE Trans, on VLSI Systems, Vol. 5, No. 3, pp. 270-276, 1997
27. V. Székely and M. Rencz, "A New Monolithic Temperature Sensor: The Thermal-Feedback Oscillator," Proc. Transducers '95 and Eurosensors IX, Stockholm, Sweden, June 1995, pp. 124-127.