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Volumn 398, Issue 1-2, 1998, Pages 49-59

Electron capture and loss in the scattering of hydrogen and oxygen ions on a Si surface

Author keywords

Atom solid interactions; Hydrogen; Ion solid interactions; Low energy ion scattering; Oxygen; Silicon; Surface electronic phenomena

Indexed keywords

CHARGE TRANSFER; ELECTRON ENERGY LEVELS; HYDROGEN; OXYGEN; SURFACE PHENOMENA;

EID: 0032000562     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0039-6028(98)80010-1     Document Type: Article
Times cited : (40)

References (41)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.