Theory of femtosecond ellipsometry in Ge at 1.5 eV

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 568-573

  Zollner, Stefan ^a,d   Myers, K D ^a   Dolan, J M ^a   Bailey, D W ^b,e   Stanton, C J ^c  

^a IOWA STATE UNIVERSITY   (United States)

^b University of South Carolina   (United States)

^c University of Florida ^*  (United States)

^d MOTOROLA INC   (United States)

^e HEWLETT PACKARD COMPANY   (United States)

Author keywords

Ellipsometry; Femtosecond laser pulses; Germanium

Indexed keywords

CARRIER CONCENTRATION; DIFFUSION IN SOLIDS; ELLIPSOMETRY; ENERGY GAP; LASER PULSES;

BAND FILLING; COLLISIONAL BROADENING; DIELECTRIC FUNCTIONS; EXCITONIC COULOMB ENHANCEMENT; FEMTOSECOND LASER PULSES;

SEMICONDUCTING GERMANIUM;

EID: 0032000205     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00886-9     Document Type: Article

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