Scalable test generators for high-speed datapath circuits

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 12, Issue 1-2, 1998, Pages 111-125

  Al Asaad, Hussain ^a   Hayes, John P ^a   Murray, Brian T ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b GENERAL MOTORS CORPORATION   (United States)

Author keywords

Built in self test; Carry lookahead; Datapath circuits; On line testing; Scalability; Test generation

Indexed keywords

ADDERS; LOGIC CIRCUITS; MATHEMATICAL MODELS; MULTIPLYING CIRCUITS; ONLINE SYSTEMS;

BUILT IN SELF TEST (BIST); ONLINE TESTING; TEST PATTERN GENERATOR CIRCUITS (TG);

INTEGRATED CIRCUIT TESTING;

EID: 0032000124     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008242108853     Document Type: Article

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