Multiple-prototype classifier design

IEEE Transactions on Systems, Man and Cybernetics Part C: Applications and Reviews

Volumn 28, Issue 1, 1998, Pages 67-79

  Bezdek, James C ^a   Reichherzer, Thomas R ^b   Lim, Gek Sok ^a   Attikiouzel, Yianni ^b  

^a UNIVERSITY OF WEST FLORIDA   (United States)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Competitive learning; Iris data; Modified chang's method (MCA); Multiple prototypes; Nearest neighbor (1 nn) rule

Indexed keywords

ERROR ANALYSIS; LEARNING SYSTEMS;

COMPETITIVE LEARNING; MODIFIED CHANG'S METHOD (MCA); MULTIPLE PROTOTYPES; NEAREST NEIGHBOR RULE;

PATTERN RECOGNITION SYSTEMS;

EID: 0032000094     PISSN: 10946977     EISSN: None     Source Type: Journal    
DOI: 10.1109/5326.661091     Document Type: Article

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